Special seminar: Spectroscopy below the diffraction limit using Near-Field Optical Microscopy

Friday 17 May 2024, 10:15 am

The development of nanoscale technologies has led to a clear understanding that physical properties at this scale differ significantly from their macroscopic counterparts. Quantum dots and quantum wells in particular have evolved from pure laboratory models to practical commercial applications. Advances in microscopic control and observation have been crucial to their success. Techniques such as molecular beam epitaxy allow precise control of structure size, while electron and atomic force microscopy allow detailed observation. However, there are still limitations to optical methods, particularly due to the diffraction limit. Here, techniques such as scattering scanning near-field optical microscopy (s-SNOM) offer promising solutions. With s-SNOM, a spatial resolution can be achieved that is only limited by the size of an atomically sharp tip. In my talk, I will introduce the s-SNOM technique and discuss its basic principles and practical applications in detail.

Friday 17 May 2024, 10:15 am
Dr. Erik Kirstein , Los Alamos National Laboratory, US
Huygens building, HG00.303