Electron microscopy

The department of General Instrumentation hosts two transmission (TEM) and one scanning (SEM) electron microscope and various EM auxillary devices. This equipment is managed by Geert-Jan Janssen, who is also the person in charge of giving instructions and technical supervision. The GI equipment is available to all researchers and students of departments of the Faculty of Sciences. (For use by persons outside the faculty costs are charged). Users with enough experience may utilize some devices on their own, pending agreement with the assistant. They should use the digital booking system to reserve time.

The following EM equipment is available:

• Transmission EMs: Jeol 1400 and Jeol 2100 with EDS detection and cryo-tomography
• TEM auxillary devices: coaters, (cryo)ultra-microtome, high-pressure freezer, Vitrobot, freeze-substitution unit, knife cutter, freeze-plunger
• Scanning EM: Jeol 6330 Cryo fesem
• SEM auxillary equipment: cryo-unit, coater, critical point dryer
• Image analysis computer